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Visualize your sample and measure thin film thickness and optical constants in seconds.
"With Auto SE, routine work will never be the same!"
NEW NIR Extended Spectral Range !
Products: UVISEL Plus: 190-920 nm | NIR Option: 2100 nm
Measure thin film thickness and optical constants. The reference ellipsometer for research and process development.
The APHA-370 continuously monitors atmospheric THC, NMHC, and CH4 concentrations...
The APMA-370 is a device for continuously monitoring CO concentrations using a coss-modulation NDIR...
The APNA-370 continuously monitors atmospheric NO, NO2 and NOx concentrations using a cross-flow modulated semi...
The APOA-370 employs an independent, internal dry-method sampling device to achieve the highest levels of sensitivity...
The APSA-370 continuously monitors atmospheric SO2 using UV fluorescence...
HORIBA’s data management and reporting software package provides data collection, management, analysis and reporting...
HORIBA’s intelligent data acquisition system (DAS) using a desktop or industrial PC, designed for fully automatic monitoring stations. The entire data capture and mean value calculation as well as control of the analyzers is...
The LA-930 uses Mie Scattering (laser diffraction) to measure particle size of suspensions or dry powders. The speed and ease-of-use of this technique makes it the most popular for many applications.
The LB-550, using a dynamic light scattering technique, is able to measure very concentrated suspensions, up to 40% solids in many cases, over a size range of 1nm-6µm.
HORIBA designs, assembles, calibrates and tests complete integrated systems for simultaneously measuring multiple pollutants. A system for monitoring five pollutants can typically fit into one 19-inch rack. Rack-mounted systems...