Manufacturing Process Control
& Management

High precision, high-speed measurement of low concentrations of HF, HCl, and NH3. Resistance sensor.

For use in combination with Manufacturing Devices. Low-cost reticle/mask particle inspection with enhanced versatility and compactness.

MP-32S/M requires SEM as excitation source and it can evaluate defects, impurities and crystalline construction in micro region.

MR-VS series are new special instruments for spectrum measurement which employ compact spectrograph and optical fiber.

Easy measurement of cathodoluminescence spectrograph by mounting to SEM.

Over the past several decades, HORIBA has designed and manufactured a complete line of high-quality non-dispersing infrared analyzers and analyzer systems. HORIBA has extended infrared gas analyzer technology to the continuous...

This field-type dissolved oxygen meter measures dissolved oxygen concentration (DO), oxygen concentration (O2), saturation (SAT.RATIO) and temperature of water solutions. It uses a laboratory sensor to enable BOD measurement....

The OPSA-150 is a new organic pollutant monitor that uses HORIBA's proprietary Rotary Cell Length Modulation, a measuring technique incorporating 25 years of expertise.

The compact LA-350 uses Mie scattering (laser diffraction) to measure particle size quickly and easily. The speed and ease of this technique makes it popular for most particle sizing applications

Silicon crystal is widely used in semiconductors. The PHOTOLUMINOR-D has been designed especially for quantitative impurity analysis of silicon crystals with high sensitivity.

The application of photoluminescence for the quality...

The PHOTOLUMINOR-S has been designed for R&D in many applications and provides high performance and easy operation.   High-sensitivity measurement is important for detecting weak photoluminescence...