Analysis based on
Analysis based on
structure, material state, density
of molecule & crystal
Visualize your sample and measure thin film thickness and optical constants in seconds.
"With Auto SE, routine work will never be the same!"
NEW NIR Extended Spectral Range !
An economical gloss meter which utilizes a separate detector and light source, offers the ability to switch between 60 degree measuring angle for standard gloss measurement, and 20 degree measuring angle for high-gloss surfaces...
- For ultra high gloss measurement
- Dual range gloss meter
- Flexible use with its remote probe
- Measuring angle 60°
- Dual range 0-100 and 0-1000
Designed to meet the demands of biologists and research scientists alike, the OpenPlex is a compact surface plasmon imaging system with an accessible platform.
In-Line Spectroscopic Ellipsometer for Web Coater and Roll to Roll Systems
Products: UVISEL Plus: 190-920 nm | NIR Option: 2100 nm
Measure thin film thickness and optical constants. The reference ellipsometer for research and process development.
XelPleX is the ideal solution for label-free and multiplexed molecular interaction analysis.