Surface Analysis

A range of fiber optic coupled Raman probe heads for remote analysis. Suitable for immersion and high temperature/pressure conditions.

SEM and Optical Microscopes are important instruments for the research, development and Q/C of materials. Up to now, the preparation needed to get a true sample surface requires high-level technical know-how and many hours.

By using TENSEC, anyone can prepare a surface in just 10 seconds (the World’s first).

HORIBA Scientific’s triple grating Raman spectrometers offer the ultimate in spectroscopic performance, and are ideally suited for fundamental research and advanced application of chemical analysis using Raman spectroscopy.

In-Line Spectroscopic Ellipsometer for Web Coater and Roll to Roll Systems

Products: UVISEL Plus: 190-920 nm | NIR Option: 2100 nm

Measure thin film thickness and optical constants. The reference ellipsometer for research and process development.

Integrated Spectroscopic Ellipsometer and Spectroscopic Reflectometer

XelPleX is the ideal solution for label-free and multiplexed molecular interaction analysis.

Single point analysis and automated hyperspectral imaging.

Dual vacuum modes.

Spot sizes from 1.2 mm to 10 µm.