Qualitätsprüfung

Measure the ultra-low density of silica at the finest sensitivity of 0.01 µg/L (0.01 ppb).

Messungen von Lichtreflektionen mit Hilfe des IG-331 ermöglichen Aussagen über Politur- und Reinheitszustände von Oberflächen.

 

• For ultra high gloss measurement
• Dual range gloss meter
• Flexible use with its remote probe
• Measuring angle 60°
• Dual range 0-100 and 0-1000

 

Ideal for ozone fluid density control in semiconductor production processes

The LA-930 uses Mie Scattering (laser diffraction) to measure particle size of suspensions or dry powders. The speed and ease-of-use of this technique makes it the most popular for many applications.

The LB-550, using a dynamic light scattering technique, is able to measure very concentrated suspensions, up to 40% solids in many cases, over a size range of 1nm-6µm.

High precision, high-speed measurement of low concentrations of HF, HCl, and NH3. Resistance sensor.

For use in combination with Manufacturing Devices. Low-cost reticle/mask particle inspection with enhanced versatility and compactness.

Designed to meet the demands of biologists and research scientists alike, the OpenPlex is a compact surface plasmon imaging system with an accessible platform.

Achieves dramatic cost reductions in advanced mask inspections