Industry
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Ideal for hydrofluoric acid monitoring in semiconductor manufacturing
Messungen von Lichtreflektionen mit Hilfe des IG-331 ermöglichen Aussagen über Politur- und Reinheitszustände von Oberflächen.
- For ultra high gloss measurement
- Dual range gloss meter
- Flexible use with its remote probe
- Measuring angle 60°
- Dual range 0-100 and 0-1000
The iHR320 provides a platform for spectroscopic measurements for years to come.
The iHR550 spectrometer offers a unique combination of spectral quality, flexibility, robustness, and ease of use that makes it the ideal general-purpose spectrometer for performing spectral measurements with quality results.
Ideal for ozone fluid density control in semiconductor production processes
The LA-930 uses Mie Scattering (laser diffraction) to measure particle size of suspensions or dry powders. The speed and ease-of-use of this technique makes it the most popular for many applications.
The LB-550, using a dynamic light scattering technique, is able to measure very concentrated suspensions, up to 40% solids in many cases, over a size range of 1nm-6µm.
The HORIBA Jobin Yvon family of NIR array detectors, the Symphony Series, feature spectroscopic grade InGaAs detectors in a linear array of 512 or 1024 pixels.