Natural Resources & Infrastructure

Products: UVISEL Plus: 190-920 nm | NIR Option: 2100 nm

Measure thin film thickness and optical constants. The reference ellipsometer for research and process development.

Integrated Spectroscopic Ellipsometer and Spectroscopic Reflectometer

Multi-Component Gas Analyzer VA-5000 Series is an all-round analyzer that fits today’s measurement needs ...

Single point analysis and automated hyperspectral imaging.

Dual vacuum modes.

Spot sizes from 1.2 mm to 10 µm.