
Industry
制造业
MP-32S/M requires SEM as excitation source and it can evaluate defects, impurities and crystalline construction in micro region.
MR-VS series are new special instruments for spectrum measurement which employ compact spectrograph and optical fiber.
Easy measurement of cathodoluminescence spectrograph by mounting to SEM.
Endpoint controller for plasma etch cluster tools: Simultaneous Real Time Multi-Chamber - Multi diagnosis monitor
HORIBA推出采用具有25年以上丰富经验的独特测量方法---「旋转式单元长度调整系统」的新型紫外线吸收法COD连续检测仪。此装置可用于以下 三个主要方面:水质总量控制中排出口的有机污染物质的监测,水源地取水口处的有机污染物质的监测,工业过程中的有机污染物质的监测,如酚的监测等。
Silicon crystal is widely used in semiconductors. The PHOTOLUMINOR-D has been designed especially for quantitative impurity analysis of silicon crystals with high sensitivity.
The application of photoluminescence for the quality...










