半导体

UVISEL FUV光谱型椭偏仪将UVISEL VIS的工作波段扩展到190nm。

UVISEL ER扩展波段光谱型椭圆偏仪覆盖从190到2100纳米的宽光谱范围。

The UVISEL VUV ellipsometer provides the best combination of superior VUV performance and experimental flexibility to determine thin film thickness and optical constants across the wavelength range 142 to 880 nm.

HORIBA EMGA-600W 是一款将氧/氮分析仪和定氢仪结合起来的分析仪器。它利用惰性气体熔融法测定钢铁、有色金属、半导体、电子等材料中的氧、氮、氢元素的含量。

H-20单色仪采用凹面像差校正全息光栅

The LA-930 uses Mie Scattering (laser diffraction) to measure particle size of suspensions or dry powders. The speed and ease-of-use of this technique makes it the most popular for many applications.

Real time interferometric endpoint for depth targeting.

和成像摄谱仪或者扫描单色仪一样，新型的自动MicroHR允许用户实现快速精确的测量，以及其他类似焦距的光谱仪无法提供的多种用途。

The NIR MicroHR is a 140 mm focal length spectrometer featuring gold optics (for increased through-put in the NIR spectral region) and interchangeable gold gratings for optimization of optical components and wavelength range selection.

Silicon crystal is widely used in semiconductors. The PHOTOLUMINOR-D has been designed especially for quantitative impurity analysis of silicon crystals with high sensitivity.

The application of photoluminescence for the quality...