Highly Sensitive Silica Monitor SLIA-300

Measure the ultra-low density of silica at the finest sensitivity of 0.01 µg/L (0.01 ppb).

IG-331 Gloss Checkers

Messungen von Lichtreflektionen mit Hilfe des IG-331 ermöglichen Aussagen über Politur- und Reinheitszustände von Oberflächen.

High Gloss Meter IG-410

     

  • For ultra high gloss measurement
  • Dual range gloss meter
  • Flexible use with its remote probe
  • Measuring angle 60°
  • Dual range 0-100 and 0-1000
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In-line type Dissolved Ozone Monitor OZ-96i

Ideal for ozone fluid density control in semiconductor production processes

 

LA 930

The LA-930 uses Mie Scattering (laser diffraction) to measure particle size of suspensions or dry powders. The speed and ease-of-use of this technique makes it the most popular for many applications.

LB550

The LB-550, using a dynamic light scattering technique, is able to measure very concentrated suspensions, up to 40% solids in many cases, over a size range of 1nm-6µm.

Low Concentration HF/HCl/NH3 Monitor HF-960M

High precision, high-speed measurement of low concentrations of HF, HCl, and NH3. Resistance sensor.

PR-PD5 Particle detection system

For use in combination with Manufacturing Devices. Low-cost reticle/mask particle inspection with enhanced versatility and compactness.

OpenPlex

Das sowohl für die Anforderungen von Biologen als auch für Forschungsanwendungen ausgelegte OpenPlex ist ein kompaktes System für die bildgebende Oberflächenplasmonenresonanz, das mit einer flexiblen Plattform ausgestattet ist.

PR-PD2HR Particle detection system

Achieves dramatic cost reductions in advanced mask inspections