Material & Property Characterization

The investigation of ultrafast dynamics in chemistry and biology demands information over a wide spectral range to identify the changing concentration of species and molecular exci-tation.

In-Line Spectroscopic Ellipsometer for Web Coater and Roll to Roll Systems

Integrated Spectroscopic Ellipsometer and Spectroscopic Reflectometer

XelPleX is the ideal solution for label-free and multiplexed molecular interaction analysis.

Single point analysis and automated hyperspectral imaging.

Dual vacuum modes.

Spot sizes from 1.2 mm to 10 µm.