Manufacturing Process Control
& Management

The HORIBA Scientific GD-Profiler HR™ gives the optimum in terms of resolution and number of elements to solve analytical problems even in the most complex matrices.

High throughput compact rugged spectrograph, suitable for dedicated Raman analysis and portable applications. Available rack mounted for industrial settings.

Measure the ultra-low density of silica at the finest sensitivity of 0.01 µg/L (0.01 ppb).

• High efficiency measurement
• Measuring angles 20° and 60°
• Flexible use with its remote probe
• Range 0-100
• Cost Effective

 

 

• For ultra high gloss measurement
• Dual range gloss meter
• Flexible use with its remote probe
• Measuring angle 60°
• Dual range 0-100 and 0-1000

 

Ideal for ozone fluid density control in semiconductor production processes

The LA-930 uses Mie Scattering (laser diffraction) to measure particle size of suspensions or dry powders. The speed and ease-of-use of this technique makes it the most popular for many applications.

The LB-550, using a dynamic light scattering technique, is able to measure very concentrated suspensions, up to 40% solids in many cases, over a size range of 1nm-6µm.

High precision, high-speed measurement of low concentrations of HF, HCl, and NH3. Resistance sensor.

For use in combination with Manufacturing Devices. Low-cost reticle/mask particle inspection with enhanced versatility and compactness.