Raman spectrometers and microscopes give highest definition images for a broadest range of samples and high resolution options probe subtle phase and structural properties of nano-materials.

Fully integrated solutions for near-field optical techniques (SNOM, NSOM) and tip-enhanced Raman spectroscopy (TERS).

The SZ-100 analyses particles between 0.3nm and 8μm. (For larger size range see the LA-950V2) and quantifies zeta potential.

For non-destructive thin film characterization in material research, ellipsometers enable users to characterize thin film thickness, optical constants and many other material properties of nano and micro layer

NIR Photoluminescence mapping of SWNTs
Anisotropy Studies of Sol-gels