Instrumentation for photoluminescence (PL) and Raman spectroscopy to give a better understanding of  semiconductor materials and quantum dots (QD).

Photoluminescence Quantum Yield and fluorescence lifetime measurements
Pl and PLE of GaN
Size and compositional studies of Qdots

Photoluminescence Quantum Yield measurements (PLQY)

Glow Discharge elemental depth profiling provide rapid analysis of complex layered semiconductor structures – sometimes up to 100 layers thick.

Careful quality control of materials such as those used in wafer fabrication may be achieved by accurate particle size analysis.

Widely used in both semiconductor research and microelectronic industries, ellipsometers enable users to characterize thin film thickness, optical constants, bandgap, crystallinity, interfaces and more of multilayer structures over a large spectral range from DUV to NIR